We have demonstrated a high-resolution (250nm, 10mK), non-contact modulated reflectance imaging technique which, in combination with an energy balance model, can be used for spatially resolved thermal, optical, and electrical metrology of optoelectronic devices.  Applications include optical testing of photonic integrated circuits, current spreading and thermal management in light emitting diodes, thermal lensing in vertical cavity surface emitting lasers, and nondestructive testing of solar cells. Most recently, we have used this technique to examine carrier transport in organic field effect transistors.